Egyptian Organization for Standards & Quality

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37.020

Standard No. 3848-10 / 2007
Price 0 L.E.
Optics and photonics - Preparation of drawings for optical elements and systems - Part 10: Table representing data of optical elements and cemented assemblies
Standard No. 7689-1 / 2013
Price 310 L.E.
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Optics and optical instruments-specifications for telescopic sights Part 1 : general-purpose instruments
Standard No. 7689-2 / 2013
Price 295 L.E.
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Optics and optical instruments-specifications for telescopic sights Part 2 : high performance instruments
Standard No. 7796 / 2014
Price 250 L.E.
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Microscopes – values, tolerances and symbols for magnification
Standard No. 3931-2 / 2019
Price 715 L.E.
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Nuclear energy — reference beta-particle radiation part 2: calibration fundamentals related to basic quantities characterizing the radiation field0
Standard No. 4619-2 / 2024
Price 400 L.E.
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Reference radiation fields -- simulated workplace neutron fields Part 2: calibration fundamentals related to the basic quantities
Standard No. 7981-1 / 2021
Price 460 L.E.
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Optics and optical instruments-test methods for telescopic systems. Part 1 : test methods for basic characteristics .
Standard No. 3551-22 / 2024
Price 325 L.E.
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Optics And Photonics- Environmental Test Methods Part 22: Combined Cold, Dry Heat Or Temperature Change With Bump Or Random Vibration
Standard No. 8423 / 2020
Price 580 L.E.
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Optics and photonics — guidance for the selection of environmental tests
Standard No. 3848-18 / 2023
Price 490 L.E.
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OPTICS AND PHOTONICS — PREPARATION OF DRAWINGS FOR OPTICAL ELEMENTS AND SYSTEMS — PART 18: STRESS BIREFRINGENCE, BUBBLES AND INCLUSIONS, HOMOGENEITY, AND STRIAE
Standard No. 8858 / 2024
Price 490 L.E.
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MICROBEAM ANALYSIS ANALYTICAL ELECTRON MICROSCOPY VOCABULARY
Standard No. 8859 / 2024
Price 835 L.E.
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MICROBEAM ANALYSIS ANALYTICAL ELECTRON MICROSCOPY METHODS FOR CALIBRATING IMAGE MAGNIFICATION BY USING REFERENCE MATERIALS WITH PERIODIC STRUCTURES
Standard No. 8862 / 2024
Price 1,060 L.E.
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MICROBEAM ANALYSIS SCANNING ELECTRON MICROSCOPY QUALIFICATION OF THE SCANNING ELECTRON MICROSCOPE FOR QUANTITATIVE MEASUREMENTS
Standard No. 8863 / 2024
Price 445 L.E.
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MICROBEAM ANALYSIS SCANNING ELECTRON MICROSCOPY GUIDELINES FOR CALIBRATING IMAGE MAGNIFICATION
Standard No. 8864 / 2024
Price 880 L.E.
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MICROBEAM ANALYSIS SCANNING ELECTRON MICROSCOPY METHOD FOR EVALUATING CRITICAL DIMENSIONS BY CD-SEM
Standard No. 8865 / 2024
Price 1,480 L.E.
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MICROBEAM ANALYSIS SCANNING ELECTRON MICROSCOPY METHODS OF EVALUATING IMAGE SHARPNESS