Standards
Standards
»Metrology
8859 / 2024
MICROBEAM ANALYSIS ANALYTICAL ELECTRON MICROSCOPY METHODS FOR CALIBRATING IMAGE MAGNIFICATION BY USING REFERENCE MATERIALS WITH PERIODIC STRUCTURES
Endorsement Date
26-02-2024
Pages Count
49
Sector
Metrology
Committee Name
Micron beam analysis.
Standard Type
Price
835 L.E.
Main References
ISO : 29301:2023
Standard Status
Adopted
Obligatory Status
Not Obligatory
Decisions Number
ICS
37.020