Standards
Standards
»Metrology
8863 / 2024
MICROBEAM ANALYSIS SCANNING ELECTRON MICROSCOPY GUIDELINES FOR CALIBRATING IMAGE MAGNIFICATION
Endorsement Date
26-02-2024
Pages Count
23
Sector
Metrology
Committee Name
Micron beam analysis.
Standard Type
--
Price
445 L.E.
Main References
ISO 16700:2016(Confirmed in 2023)
Standard Status
Adopted
Obligatory Status
Not Obligatory
Decisions Number
ICS
37.020