This International Standard specifies a method for calibrating the magnification of images generated by a scanning electron microscope (SEM) using an appropriate reference material. This method is limited to magnifications determined by the available si
26-02-2024
23
مقاييس
تحليل الشعاع الميكروني
إرشادات
445 ج.م.
ISO 16700:2016(Confirmed in 2023)
متبناه
غير الزامى
37.020