This Technical Specification specifies methods of evaluating the sharpness of digitized images generated by a scanning electron microscope (SEM) by means of a Fourier transform (FT) method, a contrast-to-gradient (CG) method and a derivative (DR) method
26-02-2024
92
مقاييس
تحليل الشعاع الميكروني
اختبارات
1,480 ج.م.
(Confirmed in 2023)ISO/TS24597:2011
متبناه
غير الزامى
37.020