This International Standard gives guidance for the identification of elements and the investigation of the presence of specific elements within a specific volume (on a μm3 scale) contained in a specimen, by analysing X-ray spectra obtained using wavelen
26-02-2024
15
مقاييس
تحليل الشعاع الميكروني
اختبارات
325 ج.م.
ISO 17470:2014(Confirmed in 2019)
متبناه
غير الزامى
71.040.99