Standards
Standards
»Metrology
8583 / 2022
Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials
Endorsement Date
27-09-2022
Pages Count
50
Sector
Metrology
Committee Name
Micron beam analysis.
Standard Type
--
Price
850 L.E.
Main References
ISO 20263/2017 : Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials
Standard Status
Adopted
Obligatory Status
Not Obligatory
Decisions Number
ICS