Standards
Standards
»Metrology
4442-2 / 2005
Reference sources for the calibration of surface contamination monitors . Part 2: Electrons of energy less than 0.15 MeV and photons of energy less than 1.5 MeV
Endorsement Date
28-08-2017
Pages Count
0
Sector
Metrology
Committee Name
Standard Type
Price
0 L.E.
Main References
Standard Status
Cancelled
Cancel Reason
الغاء مجلس 319
Obligatory Status
Not Obligatory
Decisions Number
ICS