Standards
Standards
»Metrology
4441 / 2004
Measurement of thermal conductivity of thin films on silicon substrates. (ISO /TTA 4/2002)
Endorsement Date
28-12-2018
Pages Count
0
Sector
Metrology
Committee Name
Measurements of Heat
Standard Type
Price
0 L.E.
Main References
ISO /TTA 4/2002 : Measurement of thermal conductivity of thin films on silicon substrates.
Standard Status
Cancelled
Cancel Reason
الغاء مجلس 321
Obligatory Status
Not Obligatory
Decisions Number
ICS